This device is a fully automatic functional testing machine that integrates chip thickness detection, glue separation(Card bending) detection, contactless ATS detection, contact ATR detection, and frequency detection. It has powerful functions and can be applied to the testing of standard cards such as IC cards, dual-interface cards, SIM cards, and ID cards."
| Main control system : | Japanese Keyence PLC | ||||||
| Cylinder : | Japanese SMC / Chinese AIRTAC | ||||||
| Zero sensor : | Japanese Panasonic | ||||||
| Light fiber sensor : | Japanese Panasonic | ||||||
| Screw rod : | Taiwan HIWIN | ||||||
| Guide rail and slide block : | Taiwan HIWIN | ||||||
| Power supply : | Taiwan Meanwell | ||||||
| Magnetic valve : | Japanese SMC / ChineseAIRTAC | ||||||
| Vacuum generator : | Japanese SMC / ChineseAIRTAC | ||||||
| IC card Contact reader : | Guangdong Chinese Joycreat | ||||||
| Spectrum analyzer : | Chinese Jiangsu Puyuan Rigel | ||||||
| Industry PC : | Chinese Advantech | ||||||
| Standard function configuration | |||||||
| 1 | Input card magazine 2 set | ||||||
| 2 | Car running track 2 set | ||||||
| 3 | Double stacked card inspect 2 set | ||||||
| 4 | Auto Bending test (chips sticked to cavity) 4 set | ||||||
| 5 | Auto ATR test 2 set | ||||||
| 6 | Auoto ATS test 2 set | ||||||
| 7 | Frequency test 2 set | ||||||
| 8 | Chips height test 2 set | ||||||
| 9 | Sort out defect cards 4 bins | ||||||
| 10 | Good card magazine 2 set | ||||||
| 11 | Reject bins 2 set | ||||||